专利内容由知识产权出版社提供
专利名称：Method for particle analysis发明人：Finlan, Martin Francis申请号：EP87308192.1申请日：19870916公开号：EP0261868A3公开日：190419
专利附图：
摘要：The apparatus comprises a cell 2 containing the sample 1 under investigation.Electromagnetic waves P1,P2 are applied from opposite directions and interfere with oneanother in the region of the cell to form a standing wave pattern 6. Due to electrostric‐tion effects the standing wave pattern causes particles within the sample to concentrate
in certain areas in a pattern corresponding to that of the standing wave 6. This pattern ofparticle concentration forms a grating when seen by an input wave Pin of electromagneticwave radiation and, provided conditions are correct, results in the generation of a phaseconjugate wave Pout. Means (not shown) are provided for measuring the intensity of thephase conjugate wave Pout which gives a sensitive measure of the size of the particlessuspended in the sample.
申请人：AMERSHAM INTERNATIONAL plc
地址：Amersham Place Little Chalfont Buckinghamshire HP7 9NA GB
国籍：GB
代理机构：Boydell, John Christopher
更多信息请下载全文后查看