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专利名称：System and method for measuring the
quality of an illumination field from a laserline illumination system
发明人：Nolan, John F. c/o AGFA Corporation申请号：EP02100493.2申请日：20020514公开号：EP1260801A1公开日：20021127
专利附图：
摘要：A system is disclosed for analyzing an illumination field (18) of a line of laserillumination (12). The system includes a first movable unit (22), a second movable unit (26),
and a sensor unit (16). The first movable unit (22) includes a first opening (20) throughwhich at least a portion (24) of the illumination field (18) may pass. The first movable unit(22) is adapted for movement in a first direction (B). The sensor unit (16) is adapted toreceive illumination (24) and to produce a sensor output signal representative acharacteristic of the illumination field (18). The second movable unit (26) includes asecond opening (28) through which at least a portion (24) of the illumination field (18)may pass. The second movable unit (26) is positioned between the first movable unit (22)and the sensor unit (16) and is adapted for movement (A) between at least a first positionin which very little or no light from the illumination field (18) may reach the sensor unit(16), and a second position in which a relatively high amount of light from the illuminationfield (18) may reach the sensor unit (16).
申请人：Agfa Corporation
地址：100 Challenger Road Ridgefield Park, NJ 07660-2199 US
国籍：US
代理机构：Van Ostaeyen, Marc Albert Jozef
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